NTEGRA Spectra

AFM/Confocal Raman & Fluorescence/SNOM/TERS

NTEGRA Spectra integrates the advanced technologies of both SPM and Confocal microscopy/Raman scattering spectroscopy. Using exciting new techniques such as tip enhanced Raman scattering (TERS) which uses a sharp plasmonic tip to obtain chemical information at the nanometer scale, typically up to 10 nm resolution.

NTEGRA Spectra – Brochure (1.0 MB) Visit Suppliers Website

Integration: The Key to new sciences

Change happens at interfaces and today’s most exciting changes in microscopy are happening where multiple technologies are interfaced together. NTEGRA Spectra is a prime example, uniting the full power of atomic force microscopy (AFM), Confocal Raman and fluorescence microscopy and scanning near-field optical microscopy (SNOM) in one platform.

Different Configuration of AFM with Confocal Raman/Fluorescence microscope


• AFM (mechanical, electrical, magnetic properties, nanomanipulation etc.)

• White Light Microscopy and Confocal Laser (Rayleigh) Imaging

• Confocal Raman Imaging and Spectroscopy

• Confocal Fluorescence Imaging and Spectroscopy

• Scanning Near-Field Optical Microscopy (SNOM)

• Tip Enhanced Raman and Fluorescence Microscopy (TERS, TEFS, TERFS)

Controlled environment:

• Temperature

• Humidity

• Gases

• Liquid

• Electrochemical environment

• External magnetic field

HybriD Mode™

NTEGRA Spectra is equipped with new electronics and software that allows the addition of a recently developed innovation by the name of HybriD Mode™ (HD-AFM™ Mode) for nanomechanical proprieties and Raman for chemical imaging of exactly the same area within single measurement session.